Semiconductor Test Solutions


EV-Series Test Systems

EV-Series Test Systems

 

Test Evolution’s EV-series platform builds on open industry standards such as PXI, AXIe and PCIe that enable creation of low cost, high performance systems.

 

EV518 Installed in production

EV-Series Overview

  • Applications range from silicon characterization to production IC test
  • Based on low cost industry standard AXIe and PXI
  • Modular design built from interchangeable building blocks for easy configurability
  • Air cooled zero footprint design
  • Direct-mount device loadboards
  • Cable and hard-dock device interfaces
  • Supports common manipulator & docking solutions
  • Standard prober/handler interfaces
  • Full AXIe/PXI clocking, synchronization, and triggering
  • Production Test Executive with support for multi-site pin maps, STDF datalog, prober/handler control, etc.
  • Test programs developed in MS Visual Studio & NI TestStand

 

EV-Series Platform

EV500 Test System – Read More

EV500 Test System

EV500 Test System

  • Basic system building block
  • 5 AXIe slot system
  • Up to 768 channels of digital
  • Up to 192 channels of DUT power supplies
  • Easily interchangeable device loadboards
  • Integrated bidirectional triggering between instruments and external signals
  • Customizable cabling and signal routing for external instruments
  • Ideal for device characterization and production test

 

 

EV518 Test System

EV518 Test System – shown with optional PXI instrumentation

EV518 Test System – Read More

 

 

 

 

EV1018 Test System

EV1018 Test System – shown with optional PXI instrumentation

EV1018 Test System – Read More

 

 

 

 

 

 

 

EV1000 Expansion Space

EV-Series Custom Configurations – Read More

  • Integral EV500 Test System(s)
  • Customizable internal 19″ rack space
  • Ability to add custom instrumentation
  • Integrate one or more additional industry-standard chassis:
    • AXIe
    • PXI / PXIe
    • PCIe
  • Simple, flexible cabling and signal routing to testhead

 

 

 

 

 

 

 


 

EV-Series Semiconductor Test Services

EV-Series Semiconductor Test Services

EV-Series Semiconductor Test Services

Test Services – Read More

We offer a variety of services that include:

  • Developing test programs and loadboards
  • Configuration and final integration of EV-Series test systems
  • Design of custom test instrumentation

 

 

 

 

 

 

 


EV-Series Instruments

CIF - System Module

CIF – System Module

CIF – System Module – Read More

  • PCIe support for EV-Series test systems
  • 32 software controlled Cbits for load board relay control
  • User supplies for load board circuitry
  • System level trigger matrix and external trigger I/O integration
  • System clock support 10 MHz reference, 100 MHz, ext clock option
  • Digital Synchronization Module

 

DPS12 System Power Supplies

DPS12 Device Power Supplies

DPS12 – Device Power Supply – Read More

  • 12 independent voltage supply channels
  • -20V / +22V in 3 ranges – negative / bipolar / positive
  • 6 current ranges 25 uA to 1.2 A, 2.4 A with channel ganging
  • Parametric measurement per channel with digitizer memory
  • Triggerable measurements and waveform source

 

DPS48 Device Power Supplies

DPS48 Device Power Supplies

DPS48 – Device Power Supply – Preliminary Information

  • 48 independent voltage supply channels
  • Channels 1-12 compatible with DPS12 connector pinout
  • -7.5V / +7.5V
  • 6 current ranges 5 uA to 1.2A, with channel ganging
  • Parametric measurement per channel with digitizer memory
  • Triggerable measurements

 

DD48 Digital Subsystem

DD48 Digital Subsystem

DD48 – Digital Subsystem – Read More

  • 48 channel mixed-signal digital subsystem
  • 100 / 200 / 400 MVectors/sec data rates
  • 32 / 64 / 128 MV pattern memory, 128M source/capture memory
  • 127 global timing sets / 32 edgesets / 32 period sets
  • -2v to 6.0v drive/compare levels with active load
  • PMU per channel
  • Software debug tools including pattern debugger

 

DD192 Digital Subsystem

DD192 Digital Subsystem

DD192 – Low Cost Digital Subsystem – Preliminary Information

  • 192 channel mixed-signal digital subsystem
  • 100 / 200 MVector/sec data rates
  • 64 / 128 MV pattern memory
  • 127 global timing sets / 32 edgesets / 32 period sets
  • -1.5v to 6.0v drive/compare levels with active load
  • PMU per channel
  • Software debug tools including pattern debugger

 

AXIe Starter Board

AXIe Starter Board

AXIe Starter Board – Read More

  • AXIe 3.1 Infrastructure support
  • PCI Express Endpoint
  • Instrument Clocks
  • Calibration Bus and Analog Bus access
  • 4 Differential Star Trigger lines
  • 152 DUT I/O Signals

 

Optional 3rd-Party PXI Chassis

Optional 3rd-Party Chassis and Instrumentation

Optional Instrumentation Expansion – Read More

  • Customizable 19″ rack space in EV518 / EV1018
  • Optional industry-standard chassis and instrumentation
  • Customizable cabling and signal routing to testhead

 

 


 Test system and instrument datasheets are available here.


All Test Evolution AXIe chassis and instruments comply with the AXIe 3.1 standard.AXIe-89x36