DD48 – Digital Subsystem


The DD48 is a self-contained, single slot AXIe 3.1, 48 channel mixed-signal digital test subsystem. Each DD48 has an independent sequencer controller with pattern generators, and an independent per-channel timing system. Integrated timing generators connect directly to the instrument’s pin electronics. Each board can operate independently or synchronously with other DD48 cards.

Pattern Generator Features

  • 32M Unrestricted (128M in HighSpeed Mode) vector memory
  • 128M digital sample source/capture memory parallel per channel
  • Match mode – parallel and serial.
  • Flexible micro-instructions supporting nested loops and subroutines
  • Flexible mixed signal triggering
  • 8-channel granularity of most functions for test & cost efficiency

Timing & Formatting Features

  • 100/200/400 MVpS data rates
  • 32 per-pin flexible edge sets
  • 32 period sets (10ns to 671mS periods)
  • 127 global timing sets on-the-fly
  • Window and strobe compare formats
  • Flexible drive formats supporting mixed-signal applications
  • 4 flexible edges per pin for unique formats & applications

Driver, Comparator & Load Features

  • -2v to +6.0v Range
  • Active load up to 12mA source and sink
  • 1 high voltage driver (12v) per 8pins

Per Pin PMU Features

  • Force Voltage, Measure Current
  • Force Current, Measure Voltage
  • Voltage clamps
  • 5 current ranges (2uA to 32mA)
  • -2v to +6.0v Range
  • Hardware measurement averaging & histogram support

Software / Programming

  • Pattern compiler
  • Full API access to board functionality and debug capability
  • Debug tools including:
    • Pattern Debugger

Test system and instrument datasheets are available here.

All Test Evolution AXIe chassis and instruments comply with the AXIe 3.1 standard. AXIe-89x36